Fracture of Materials and Structures form Micro to Macro Scales
Book title Buchtitel
Fracture of Materials and Structures form Micro to Macro Scales
Publisher Herausgeber
ESIS
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Preview | Authors / Editors | Title | Type | Issue Date | |
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1 | Gager, Jakob ; Karunamurthy, Balamurugan ; Nelhiebel, Michael ; Pettermann, Heinz E. | Finite Element Based Simulations of Interface Cracks in Semiconductor Devices - A Study on Geometry Parameters and Delamination Configurations | Konferenzbeitrag Inproceedings | 2010 |