Optical Fabrication, Testing, and Metrology IV
Book title Buchtitel
Optical Fabrication, Testing, and Metrology IV
Publisher Herausgeber
SPIE
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| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Bammer, Ferdinand ; Petkovsek, Rok | SCPEM-based polarization modulation ellipsometry in the NIR | Konferenzbeitrag Inproceedings | 2011 |