Optical Fabrication, Testing, and Metrology IV

Book title Buchtitel

Publisher Herausgeber

SPIE

Results 1-1 of 1 (Search time: 0.002 seconds).

RIS EndNote Bibtex Send via email

		Preview	Author(s)	Title	Type	Issue Date
	1		Bammer, Ferdinand ; Petkovsek, Rok	SCPEM-based polarization modulation ellipsometry in the NIR	Konferenzbeitrag Inproceedings	2011