Proceedings Symposium on VLSI Technology

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Proceedings Symposium on VLSI Technology
 

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PreviewAuthor(s)TitleTypeIssue Date
1Khalil, N. ; Faricelli, John ; Bell, D. ; Selberherr, Siegfried A Novel Method for Extracting the Two-Dimensional Doping Profile of a Sub-Half Micron MOSFETKonferenzbeitrag Inproceedings1994