2005 International Conference On Simulation of Semiconductor Processes and Devices

Book title Buchtitel
2005 International Conference On Simulation of Semiconductor Processes and Devices
 
Publisher Herausgeber
IEEE
 

Publications Publikationen



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Author:  Kosina, H.
Author:  Pourfath, M.

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PreviewAuthor(s)TitleTypeIssue Date
1Pourfath, M. ; Kosina, H. ; Cheong, B.H. ; Park, W.J. Geometry-dependence of the DC and AC Response of Ohmic Contact Carbon Nanotube Field Effect TransistorsKonferenzbeitrag Inproceedings2005