Abstracts IEEE 2006 Silicon Nanoelectronics Workshop

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Abstracts IEEE 2006 Silicon Nanoelectronics Workshop
 

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PreviewAuthor(s)TitleTypeIssue Date
1Sverdlov, Viktor ; Ungersböck, Stephan Enzo ; Kosina, Hans ; Selberherr, Siegfried Comparative Study of Low-Field Mobilities in Double- and Single-Gate Ultra-Thin Body SOI for Different Substrate OrientationsKonferenzbeitrag Inproceedings 2006
2Karner, Markus ; Gehring, Andreas ; Holzer, Stefan ; Wagner, Martin ; Kosina, Hans Continuum Versus Quasi-Bound State Tunneling in Novel Device ArchitecturesKonferenzbeitrag Inproceedings 2006
3Dhar, Siddhartha ; Ungersböck, Stephan Enzo ; Kosina, Hans ; Grasser, Tibor ; Selberherr, Siegfried Electron Mobility Model for #lt110#gt Stressed Si Including Strain-Dependent MassKonferenzbeitrag Inproceedings 2006
4Entner, Robert ; Grasser, Tibor ; Enichlmair, H. ; Minixhofer, R. Influence of Interface and Oxide Traps on Negative Bias Temperature InstabilityKonferenzbeitrag Inproceedings 2006