Proceedings from the 34th International Symposium for Testing and Failure Analysis
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Proceedings from the 34th International Symposium for Testing and Failure Analysis
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| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Heer, Michael ; Pogany, Dionyz ; Street, M. ; Smith, I. ; Riedlberger, F. ; Bonfert, D. ; Gieser, H. | Transient latch-up analysis of power control device with combined light emission and backside transient interferometric mapping methods | Konferenzbeitrag Inproceedings | 2008 |