Proceedings of the IEEE International Reliability Physics Symposium (IRPS)

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Author: Kaczer, Ben

Author: Gös, Wolfgang

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		Preview	Author(s)	Title	Type	Issue Date
	1		Grasser, Tibor ; Kaczer, Ben ; Gös, Wolfgang ; Aichinger, T. ; Hehenberger, Philipp Paul ; Nelhiebel, M.	A Two-Stage Model for Negative Bias Temperature Instability	Konferenzbeitrag Inproceedings	2009
	2		Hehenberger, Philipp Paul ; Aichinger, T. ; Grasser, Tibor ; Gös, Wolfgang ; Triebl, Oliver ; Kaczer, Ben ; Nelhiebel, M.	Do NBTI-Induced Interface States Show Fast Recovery? A Study Using a Corrected On-The-Fly Charge-Pumping Measurement Technique	Konferenzbeitrag Inproceedings	2009