Proceedings of the 20#^{th} European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis

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Proceedings of the 20#^{th} European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis
 

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PreviewAuthor(s)TitleTypeIssue Date
1Hehenberger, Philipp Paul ; Wagner, Paul-Jürgen ; Reisinger, H. ; Grasser, Tibor On the Temperature and Voltage Dependence of Short-Term Negative Bias Temperature StressKonferenzbeitrag Inproceedings2009