Proceedings of the 20#^{th} European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis
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Proceedings of the 20#^{th} European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis
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Preview | Authors / Editors | Title | Type | Issue Date | |
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1 | Hehenberger, Philipp Paul ; Wagner, Paul-Jürgen ; Reisinger, H. ; Grasser, Tibor | On the Temperature and Voltage Dependence of Short-Term Negative Bias Temperature Stress | Konferenzbeitrag Inproceedings | 2009 |