2009 IEEE International Electron Devices Meeting (IEDM)
Book title Buchtitel
2009 IEEE International Electron Devices Meeting (IEDM)
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| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Grasser, T. ; Reisinger, H. ; Goes, W. ; Aichinger, Th. ; Hehenberger, Ph. ; Wagner, P.-J. ; Nelhiebel, M. ; Franco, J. ; Kaczer, B. | Switching oxide traps as the missing link between negative bias temperature instability and random telegraph noise | Konferenzbeitrag Inproceedings | 2009 |