2009 IEEE International Electron Devices Meeting (IEDM)

Book title Buchtitel
2009 IEEE International Electron Devices Meeting (IEDM)
 

Publications Publikationen

Results 1-1 of 1 (Search time: 0.001 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Grasser, T. ; Reisinger, H. ; Goes, W. ; Aichinger, Th. ; Hehenberger, Ph. ; Wagner, P.-J. ; Nelhiebel, M. ; Franco, J. ; Kaczer, B. Switching oxide traps as the missing link between negative bias temperature instability and random telegraph noiseKonferenzbeitrag Inproceedings2009