2010 IEEE 15th Conference on Emerging Technologies & Factory Automation (ETFA 2010)

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		Preview	Author(s)	Title	Type	Issue Date
	1		Melik-Merkumians, Martin ; Zoitl, A ; Moser, T	Ontology-based fault diagnosis for industrial control applications	Konferenzbeitrag Inproceedings	2010

2010 IEEE 15th Conference on Emerging Technologies &amp; Factory Automation (ETFA 2010)