Proc. Int. Reliability Physics Symposium
Book title Buchtitel
Proc. Int. Reliability Physics Symposium
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| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Shrivastava, Mayank ; Bychikhin, Sergey ; Pogany, Dionyz ; Schneider, Jens ; Shojaei, M ; Gossner, Harald ; Gornik, Erich ; Ramgopal Rao, V | On the differences between 3D filamentation and failure of N & P type drain extended MOS devices under ESD conditions | Konferenzbeitrag Inproceedings | 2010 |