Proc. Int. Reliability Physics Symposium

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		Preview	Author(s)	Title	Type	Issue Date
	1		Shrivastava, Mayank ; Bychikhin, Sergey ; Pogany, Dionyz ; Schneider, Jens ; Shojaei, M ; Gossner, Harald ; Gornik, Erich ; Ramgopal Rao, V	On the differences between 3D filamentation and failure of N & P type drain extended MOS devices under ESD conditions	Konferenzbeitrag Inproceedings	2010