2011 IEEE International Conference of Electron Devices and Solid-State Circuits
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2011 IEEE International Conference of Electron Devices and Solid-State Circuits
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| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | de Orio, R. L. ; Selberherr, S. | Compact modeling of interconnect reliability | Konferenzbeitrag Inproceedings | 2011 | |
| 2 | Makarov, A. ; Selberherr, S. ; Sverdlov, V. | Modeling of advanced memories | Konferenzbeitrag Inproceedings | 2011 |