2011 Symposium on VLSI Technology Digest of Technical Papers
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2011 Symposium on VLSI Technology Digest of Technical Papers
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| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Toledano-Luque, M. ; Kaczer, Ben ; Franco, J. ; Roussel, Ph. J. ; Grasser, Tibor ; Hoffmann, T.Y. ; Groeseneken, G. | From Mean Values to Distributions of BTI Lifetime of Deeply Scaled FETs Through Atomistic Understanding of the Degradation | Konferenzbeitrag Inproceedings | 2011 |