2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology
Book title Buchtitel
2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology
Results 1-2 of 2 (Search time: 0.001 seconds).
| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | de Orio, Roberto Lacerda ; Selberherr, Siegfried | Formation and movement of voids in copper interconnect structures | Konferenzbeitrag Inproceedings  | 2012 | |
| 2 | Grasser, T. ; Kaczer, B. ; Reisinger, H. ; Wagner, P.-J. ; Toledano-Luque, M. | Modeling of the bias temperature instability under dynamic stress and recovery conditions | Konferenzbeitrag Inproceedings | 2012 |