Proceedings on IEEE Instrumentation and Measurement Technology Conference (I2MTC)
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Proceedings on IEEE Instrumentation and Measurement Technology Conference (I2MTC)
Results 1-3 of 3 (Search time: 0.001 seconds).
| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Yoo, Han Woong ; Verhaegen, Michel ; von Royen, Martin E. ; Schitter, Georg | Automated Adjustment of Aberration Correction in Scanning Confocal Microscopy | Konferenzbeitrag Inproceedings  | 2012 | |
| 2 | Paris, René ; Thier, Markus ; Thurner, Thomas ; Schitter, Georg | 'Shack-Hartmann Wavefront Sensor based on an Industrial Smart Camera | Konferenzbeitrag Inproceedings | 2012 | |
| 3 | Kuiper, Stefan ; Van den Hof, Paul M. J. ; Schitter, Georg | Trade-off between the control bandwidth and the measurement accuracy in Atomic Force Microscopy | Konferenzbeitrag Inproceedings | 2012 |