Proceedings of IEEE International Conference on IC Design and Technology
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Proceedings of IEEE International Conference on IC Design and Technology
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| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Franco, J. ; Kaczer, Ben ; Mitard, J. ; Toledano-Luque, M. ; Crupi, F. ; Eneman, G. ; Roussel, Ph. J. ; Grasser, Tibor ; Cho, M. ; Kauerauf, T. ; Witters, L. ; Hellings, Geert ; Ragnarsson, L. A. ; Horiguchi, N. ; Heyns, Marc M. ; Groeseneken, G. | Superior reliability and reduced Time-Dependent variability in high-mobility SiGe channel pMOSFETs for VLSI logic applications | Konferenzbeitrag Inproceedings | 2012 |