Proceedings of IEEE International Conference on Industrial Technology (ICIT)

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Proceedings of IEEE International Conference on Industrial Technology (ICIT)
 

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1Nussbaumer, Peter Walter ; Vogelsberger, Markus ; Wolbank, Thomas M. Sensitivity Analysis of Insulation State Indicator in Dependence of Sampling Rate and Bit Resolution to Define Hardware RequirementsKonferenzbeitrag Inproceedings 2013