20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
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20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
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| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Gös, Wolfgang ; Toledano-Luque, M. ; Baumgartner, Oskar ; Bina, Markus ; Schanovsky, Franz ; Kaczer, Ben ; Grasser, Tibor | Understanding Correlated Drain and Gate Current Fluctuations | Konferenzbeitrag Inproceedings | 2013 |