2014 IEEE International Electron Devices Meeting

Book title Buchtitel

Filter:

Author: Groeseneken, G.

Results 1-1 of 1 (Search time: 0.002 seconds).

RIS EndNote Bibtex Send via email

		Preview	Author(s)	Title	Type	Issue Date
	1		Franco, J. ; Kaczer, B. ; Waldron, N. ; Roussel, Ph.J. ; Alian, A. ; Pourghaderi, M. A. ; Ji, Z. ; Grasser, T. ; Kauerauf, T. ; Sioncke, S. ; Collaert, N. ; Thean, A. ; Groeseneken, G.	RTN and PBTI-induced time-dependent variability of replacement metal-gate high-k InGaAs FinFETs	Konferenzbeitrag Inproceedings	2014