Final Program 42nd International Conference on Micro and Nano Engineering
Book title Buchtitel
Final Program 42nd International Conference on Micro and Nano Engineering
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| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Kohl, Dominik ; Mesquida, Patrick ; Schitter, Georg | Quantitative DC-free Kelvin Probe Force Microscopy | Konferenzbeitrag Inproceedings | 2016 |