Proceedings of the IEEE International Integrated Reliability Workshop (IIRW)
Book title Buchtitel
Proceedings of the IEEE International Integrated Reliability Workshop (IIRW)
Results 1-2 of 2 (Search time: 0.001 seconds).
| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Kaczer, Ben ; Amoroso, S. M. ; Hussin, Razaidi ; Asenov, A ; Franco, J. ; Weckx, P. ; Roussel, Ph. J. ; Rzepa, Gerhard ; Grasser, Tibor ; Horiguchi, N. | On the distribution of the FET threshold voltage shifts due to individual charged gate oxide defects | Konferenzbeitrag Inproceedings | 2016 | |
| 2 | Puschkarsky, Katja ; Reisinger, H. ; Aichinger, T. ; Gustin, W. ; Grasser, Tibor | Threshold Voltage Hysteresis in SiC MOSFETs and Its Impact on Circuit Operation | Konferenzbeitrag Inproceedings | 2017 |