Proceedings of the IEEE International Integrated Reliability Workshop (IIRW)

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Author: Aichinger, T.

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		Preview	Author(s)	Title	Type	Issue Date
	1		Puschkarsky, Katja ; Reisinger, H. ; Aichinger, T. ; Gustin, W. ; Grasser, Tibor	Threshold Voltage Hysteresis in SiC MOSFETs and Its Impact on Circuit Operation	Konferenzbeitrag Inproceedings	2017