IEEE Proceedings of the 2003 American Control Conference
Book title Buchtitel
IEEE Proceedings of the 2003 American Control Conference
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| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Schitter, Georg ; Stemmer, A. ; Allgöwer, F. | Robust 2DOF-control of a piezoelectric tube scanner for high speed atomic force microscopy | Konferenzbeitrag Inproceedings | 2003 |