2018 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)

Book title Buchtitel
2018 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)
 
Publisher Herausgeber
IEEE
 

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Author:  Hössinger, Andreas

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PreviewAuthor(s)TitleTypeIssue Date
1Toifl, Alexander ; Simonka, Vito ; Hössinger, Andreas ; Selberherr, Siegfried ; Weinbub, Josef Steady-State Empirical Model for Electrical Activation of Silicon-Implanted Gallium NitrideKonferenzbeitrag Inproceedings2018