Proceedings of 2022 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)

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		Preview	Authors / Editors	Title	Type	Issue Date
	1		Hackl, Thomas ; Poik, Mathias ; Schitter, Georg	DC-Bias-free Surface Potential Measurements by Heterodyne AC Kelvin Probe Force Microscopy	Inproceedings Konferenzbeitrag	30-Jun-2022
	2		Csencsics, Ernst ; Schlarp, Johannes ; Glaser, Tobias ; Wolf, Tobias ; Schitter, Georg	Simulation and Reduction of Speckle-induced Uncertainty in Laser Triangulation Sensors	Inproceedings Konferenzbeitrag	2022