Proceedings 2022 IEEE 40th VLSI Test Symposium (VTS)

Book title Buchtitel

ISBN

978-1-6654-1060-1

Volume Band

2022-April

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		Preview	Authors / Editors	Title	Type	Issue Date
	1		Dave, Shail ; Marchisio, Alberto ; Hanif, Muhammad Abdullah ; Guesmi, Amira ; Shrivastava, Aviral ; Alouani, Ihsen ; Shafique, Muhammad	Special Session: Towards an Agile Design Methodology for Efficient, Reliable, and Secure ML Systems	Inproceedings Konferenzbeitrag	2022