2022 IEEE 20th International Conference on Industrial Informatics (INDIN)

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978-1-7281-7568-3

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		Preview	Authors / Editors	Title	Type	Issue Date
	1		Biffl, Stefan ; Kropatschek, Sebastian ; Kiesling, Elmar ; Meixner, Kristof ; Lüder, Arndt	Risk-Driven Derivation of Operation Checklists from Multi-Disciplinary Engineering Knowledge	Inproceedings Konferenzbeitrag	2022