2022 25th Euromicro Conference on Digital System Design (DSD)

Book title Buchtitel

ISBN

978-1-6654-7404-7

Publisher Herausgeber

IEEE

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Subject: Data Intensive Application

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		Preview	Author(s)	Title	Type	Issue Date
	1		Seyedfaraji, Saeed ; Mesgari, Baset ; Rehman, Semeen	SMART: Investigating the Impact of Threshold Voltage Suppression in an In-SRAM Multiplication/Accumulation Accelerator for Accuracy Improvement in 65 nm CMOS Technology	Inproceedings Konferenzbeitrag	31-Aug-2022