I2MTC 2022 conference proceedings : 2022 I2MTC - International Instrumentation and Measurement Technology Conference,

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978-1-6654-8360-5

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		Preview	Authors / Editors	Title	Type	Issue Date
	1		Poik, Mathias ; Mayr, Mario ; Hackl, Thomas ; Schitter, Georg	Mechatronic Demodulation for Dynamic Atomic Force Microscopy Measurement Modes	Inproceedings Konferenzbeitrag	2022