2023 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)

Book title Buchtitel
2023 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)
 
ISBN
978-1-6654-5383-7
 
Publisher Herausgeber
IEEE
 
Place of publishing Erscheinungsort
Piscataway
 

Publications Publikationen

Results 1-2 of 2 (Search time: 0.002 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Poik, Mathias ; Hackl, Thomas ; Di Martino, Stefano ; Schober, Martin ; Dang, Jin ; Schitter, Georg Analysis of Cross-Talk Induced Measurement Errors in Model-Based RF Voltage SensingInproceedings Konferenzbeitrag13-Jul-2023
2Hackl, Thomas ; Poik, Mathias ; Schitter, Georg Quantitative Surface Potential Measurements by AC Electrostatic Force MicroscopyInproceedings Konferenzbeitrag 2023