2022 IEEE 22nd International Conference on Nanotechnology (NANO)

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978-1-6654-5225-0

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	Author(s)	Title	Type	Issue Date
1	Hackl, Thomas ; Poik, Mathias ; Schitter, Georg	Influence of Imaging Parameters on AFM Surface Potential Measurements in Aqueous Solutions	Inproceedings Konferenzbeitrag	2022
2	Poik, Mathias ; Mayr, Mario ; Hackl, Thomas ; Schitter, Georg	Mechatronic Demodulation of Self-Sensing Cantilever for DC-bias free AFM Imaging in Liquid	Inproceedings Konferenzbeitrag	2022
3	Ballicchia, Mauro ; Nedjalkov, Mihail ; Weinbub, Josef	Wigner Dynamics of Electron Quantum Superposition States in a Confined and Opened Quantum Dot	Konferenzbeitrag Inproceedings	2022