2011 IEEE Conference on Microelectronic Test Structures

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		Preview	Author(s)	Title	Type	Issue Date
	1		Köck, Helmut ; Illing, Robert ; Ostermann, Thomas ; Decker, Stefan ; Dibra, Donald ; Pobegen, G. ; de Filippis, Stefano ; Glavanovics, Michael ; Pogany, Dionyz	Design of a test chip with small embedded temperature sensor structures realized in a common-drain power trench technology	Konferenzbeitrag Inproceedings	2010