IEEE International Reliability Physics Symposium (IRPS 2020)

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Description

Event name
IEEE International Reliability Physics Symposium (IRPS 2020)
 
Event type
Event for scientific audience
 
Start date
28-05-2020
End date
30-05-2020
 
Location
Waikoloa
Country
United States
 
Event format Veranstaltungsformat
On Site

Publications Publikationen

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PreviewAuthor(s)TitleTypeIssue Date
1Kruv, A. ; Kaczer, B. ; Grill, A ; Gonzalez, M. ; Franco, J. ; Linten, D. ; Goes, W. ; Grasser, T. ; De Wolf, I. On the impact of mechanical stress on gate oxide trappingKonferenzbeitrag Inproceedings 2020