39th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems

Event name
39th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems
 
Event type
Event for scientific audience
 
Start date
21-10-2025
End date
23-10-2025
 
Location
Barcelona
Country
Spain
 
Event format Veranstaltungsformat
On Site

Publications Publikationen



Results 1-1 of 1 (Search time: 0.001 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Rudolf, Dominik ; Elahi, Ardavan ; Jantsch, Axel ; Pamunuwa, Dinesh A Fault-Tolerant Voter Circuit in NEM TechnologyInproceedings Konferenzbeitrag 25-Nov-2025