SPIE Europe Optical Metrology 2007

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Description

Event name
SPIE Europe Optical Metrology 2007
 
Event type
Event for scientific audience
 
Start date
18-06-2007
End date
21-06-2007
 
Location
München
Country
Germany
 
Event format Veranstaltungsformat
On Site

Publications Publikationen

Results 1-1 of 1 (Search time: 0.001 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Oberhauser, Klaus ; Zach, Gerald ; Nemecek, Alexander ; Zimmermann, Horst Time-of-flight based pixel architecture with integrated double-cathode photodetectorKonferenzbeitrag Inproceedings18-Jun-2007