IEEE International Test Conference

Event name
IEEE International Test Conference
 
Event type
Event for scientific audience
 
Start date
08-11-2005
End date
08-11-2005
 
Country
United States
 
Event format Veranstaltungsformat
On Site

Publications Publikationen

Results 1-1 of 1 (Search time: 0.002 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Armengaud, Eric ; Rothensteiner, Florian ; Steininger, Andreas ; Pallierer, Roman ; Horauer, Martin ; Zauner, Martin A Structured Approach for the Systematic Test of Embedded Automotive Communication SystemsKonferenzbeitrag Inproceedings 2005