Microscopy and Microanalysis

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Description

Event name
Microscopy and Microanalysis
 
Event type
Event for scientific audience
 
Start date
30-07-2006
End date
03-08-2006
 
Location
Chicago, Illinois, USA
Chicago, Illinois, USA
Country
 
Event format Veranstaltungsformat
On Site

Publications Publikationen

Results 1-7 of 7 (Search time: 0.002 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Löffler, Stefan ; Ederer, Manuel 4D Energy-Filtered STEM: A New Approach for Mapping Orbital TransitionsPresentation Vortrag23-Jul-2023
2Hébert, Cécile ; Satz, A. ; Kothleitner, G. ; Eisenmenger-Sittner, Christoph ; Schattschneider, Peter Lifetime of hot electrons in metals retrived from low loss EELSKonferenzbeitrag Inproceedings2006
3Galek, Thomasz ; Hébert, Cécile ; Stöger-Pollach, Michael ; Schattschneider, Peter Numerical Aspects of Valence Electron Energy Loss SpectrometryKonferenzbeitrag Inproceedings2006
4Schattschneider, Peter ; Rubino, Stefano ; Hébert, Cécile Observation of Circular Dichroism in the TEMPräsentation Presentation2004
5Hébert, Cécile ; Rubino, Stefano ; Schattschneider, Peter ; Rusz, J. ; Novák, P. ; Hurm, C. ; Zweck, J. Observation of Magnetic Circular Dichroism in the Electron MicroscopeKonferenzbeitrag Inproceedings2006
6Schattschneider, Peter ; Stöger-Pollach, Michael Observation of metal induced gap states at a-Si/Al and c-Si/Al interfacesPräsentation Presentation2004
7Stöger-Pollach, Michael ; Hébert, Cécile ; Schattschneider, Peter ; Laister, A. Retardation Effects in Valence - EELS SpectraKonferenzbeitrag Inproceedings2006