Microscopy of Semiconducting Materials
Event name
Microscopy of Semiconducting Materials
Event type
Event for scientific audience
Start date
11-04-2005
End date
14-04-2005
Location
Oxford, UK
Country
Event format Veranstaltungsformat
On Site
Results 1-5 of 5 (Search time: 0.002 seconds).
| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Stöger-Pollach, Michael ; Pongratz, Peter | Advantages of Low Beam Energies in a TEM vor Valnce EELS | Präsentation Presentation | 2009 | |
| 2 | Pongratz, Peter ; Hyun, Y. J. ; Lugstein, A. | HRTEM Analysis of Gallium Oxide Nanostructures | Präsentation Presentation | 2009 | |
| 3 | Stöger-Pollach, Michael ; Schneider, J. ; Zandbergen, H.W. ; Schattschneider, Peter ; Gall, S. | Investigations of Bonding at an Aluminium (III) Oxide Membrane in Si using ELNES Separation | Präsentation Presentation | 2003 | |
| 4 | Stöger-Pollach, Michael ; Karl-Rückert, Eva C. ; Hébert, Cécile ; Rau, B. ; Zandbergen, H.W. ; Schattschneider, Peter ; Gall, S. | Investigations of Core Level States in Epitaxially Grown Si Layers by EELS | Präsentation Presentation | 2003 | |
| 5 | Kenda, Andreas ; Cerva, H. ; Pongratz, Peter ; Hierlemann, M. ; Liebmann, R. ; Cullis, A.G. ; Hutchison, J.L. | Strain measurements of ULSI devices using LACBED with TSUPREM modeled displacements | Konferenzbeitrag Inproceedings | 2005 |