International Design and Test Workshop (IDT)
Event name
International Design and Test Workshop (IDT)
Start date
16-12-2007
End date
18-12-2007
Location
Kairo
Country
Event format Veranstaltungsformat
On Site
Results 1-1 of 1 (Search time: 0.001 seconds).
| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Handl, Thomas ; Steininger, Andreas ; Kempf, Gerald | Adopting the Scan Approach for a Fault Tolerant Asynchronous Clock Generation Circuit | Konferenzbeitrag Inproceedings  | 2007 |