IEEE International Workshop on Electronic Design, Test and Applications
Event name
IEEE International Workshop on Electronic Design, Test and Applications
Start date
23-05-2008
End date
25-05-2008
Location
Hong-Kong
Country
Event format Veranstaltungsformat
On Site
Results 1-2 of 2 (Search time: 0.001 seconds).
| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Milbredt, Paul ; Steininger, Andreas ; Horauer, Martin | Automated Testing of FlexRay Clusters for System Inconsistencies in Automotive Networks | Konferenzbeitrag Inproceedings  | 2008 | |
| 2 | Holzer, Martin ; Rupp, Markus ; Rupp, Markus | Static Code Analysis of Functional Descriptions in SystemC | Konferenzbeitrag Inproceedings | 2006 |