2009 IEEE International Symposium on Industrial Embedded Systems, SIES 2009 Proceedings

Event name
2009 IEEE International Symposium on Industrial Embedded Systems, SIES 2009 Proceedings
 
Start date
08-07-2009
End date
10-07-2009
 
Location
Lausanne, Switzerland
Country
 
Event format Veranstaltungsformat
On Site

Publications Publikationen



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PreviewAuthor(s)TitleTypeIssue Date
1Paulitsch, H. ; Paukovits, C. ; El Salloum, C. Fault isolation with intermediate checks of end-to-end checksums in the Time-Triggered System-on-Chip ArchitectureKonferenzbeitrag Inproceedings 2009