Third International Conference on Advances in System Testing and Validation Lifecycle (VALID'11)

Event name
Third International Conference on Advances in System Testing and Validation Lifecycle (VALID'11)
 
Start date
23-10-2011
End date
29-10-2011
 
Location
Barcelona, Spain
Country
Europe
 
Event format Veranstaltungsformat
On Site

Publications Publikationen

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PreviewAuthor(s)TitleTypeIssue Date
1Erdem, Esra ; Inoue, Katsumi ; Oetsch, Johannes ; Puehrer, Joerg ; Tompits, Hans ; Yilmaz, Cemal Answer-Set Programming as a new Approach to Event-Sequence TestingKonferenzbeitrag Inproceedings 2011