2017 Annual IEEE Industrial Electronics Society´s 18th International Conference on Industrial Technology (ICIT 2017)
Event name
2017 Annual IEEE Industrial Electronics Society´s 18th International Conference on Industrial Technology (ICIT 2017)
Start date
22-03-2017
End date
25-03-2017
Location
Toronto, ON, Canada
Country
Event format Veranstaltungsformat
On Site
Results 1-2 of 2 (Search time: 0.002 seconds).
| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Wang, Guodong ; Hasani, Ramin ; Yungang, Zhu ; Grosu, Radu | A novel Bayesian network-based fault prognostic method for semiconductor manufacturing process | Konferenzbeitrag Inproceedings  | 2017 | |
| 2 | Ismail, Ahmed ; Kastner, Wolfgang | Surveying the features of industrial SOAs | Konferenzbeitrag Inproceedings | 2017 |