2017 Annual IEEE Industrial Electronics Society´s 18th International Conference on Industrial Technology (ICIT 2017)

Event name
2017 Annual IEEE Industrial Electronics Society´s 18th International Conference on Industrial Technology (ICIT 2017)
 
Start date
22-03-2017
End date
25-03-2017
 
Location
Toronto, ON, Canada
Country
 
Event format Veranstaltungsformat
On Site

Publications Publikationen

Results 1-2 of 2 (Search time: 0.002 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Wang, Guodong ; Hasani, Ramin ; Yungang, Zhu ; Grosu, Radu A novel Bayesian network-based fault prognostic method for semiconductor manufacturing processKonferenzbeitrag Inproceedings 2017
2Ismail, Ahmed ; Kastner, Wolfgang Surveying the features of industrial SOAsKonferenzbeitrag Inproceedings 2017