The 26th IEEE Asian Test Symposium (ATS´17)
Event name
The 26th IEEE Asian Test Symposium (ATS´17)
Start date
27-11-2017
End date
30-11-2017
Location
Taipei, Taiwan
Country
Event format Veranstaltungsformat
On Site
Subject
Date issued
Results 1-1 of 1 (Search time: 0.002 seconds).
| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Andjelkovic, Marko ; Krstic, Milos ; Kraemer, Rolf ; Veeravalli, Varadan Savulimedu ; Steininger, Andreas | A Critical Charge Model for Estimating the SET and SEU Sensitivity: A Muller C-Element Case Study | Konferenzbeitrag Inproceedings  | 2017 |