IEEE International Workshop on Physical Attacks and Inspection on Electronics (PAINE)
Event name
IEEE International Workshop on Physical Attacks and Inspection on Electronics (PAINE)
Start date
24-06-2018
Location
San Francisco, CA
Country
Event format Veranstaltungsformat
On Site
Results 1-1 of 1 (Search time: 0.002 seconds).
| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Kudera, Christian ; Müllner, Markus ; Kammerstetter, Markus ; Kastner, Wolfgang | Design and Implementation of a Negative Voltage Fault Injection Attack Prototype | Konferenzbeitrag Inproceedings  | 2018 |