IEEE International Electron Devices Meeting (IEDM)

Event name
IEEE International Electron Devices Meeting (IEDM)
 
Event type
Event for scientific audience
 
Start date
11-12-1988
End date
14-12-1988
 
Location
San Francisco, CA, USA
Country
 
Event format Veranstaltungsformat
On Site

Publications Publikationen

Filter:
Author:  Franco, J.
Author:  Groeseneken, G.
Author:  Sioncke, S.
Author:  Ji, Z.

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PreviewAuthor(s)TitleTypeIssue Date
1Franco, J. ; Kaczer, B. ; Waldron, N. ; Roussel, Ph.J. ; Alian, A. ; Pourghaderi, M. A. ; Ji, Z. ; Grasser, T. ; Kauerauf, T. ; Sioncke, S. ; Collaert, N. ; Thean, A. ; Groeseneken, G. RTN and PBTI-induced time-dependent variability of replacement metal-gate high-k InGaAs FinFETsKonferenzbeitrag Inproceedings2014