IEEE International Electron Devices Meeting (IEDM)

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Description

Event name
IEEE International Electron Devices Meeting (IEDM)
 
Event type
Event for scientific audience
 
Start date
11-12-1988
End date
14-12-1988
 
Location
San Francisco, CA, USA
Country
 
Event format Veranstaltungsformat
On Site

Publications Publikationen

Filter:
Author:  Gös, Wolfgang
Author:  Hehenberger, Ph.

Results 1-3 of 3 (Search time: 0.001 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Grasser, T. ; Kaczer, B. ; Goes, W. ; Reisinger, H. ; Aichinger, Th. ; Hehenberger, Ph. ; Wagner, P.-J. ; Schanovsky, F. ; Franco, J. ; Roussel, Ph. ; Nelhiebel, M. Recent advances in understanding the bias temperature instabilityKonferenzbeitrag Inproceedings2010
2Grasser, Tibor ; Kaczer, Ben ; Hehenberger, Philipp Paul ; Gös, Wolfgang ; Connor, R. ; Reisinger, H. ; Gustin, W. ; Schlünder, C. Simultaneous Extraction of Recoverable and Permanent Components Contributing to Bias-Temperature InstabilityKonferenzbeitrag Inproceedings2007
3Grasser, T. ; Reisinger, H. ; Goes, W. ; Aichinger, Th. ; Hehenberger, Ph. ; Wagner, P.-J. ; Nelhiebel, M. ; Franco, J. ; Kaczer, B. Switching oxide traps as the missing link between negative bias temperature instability and random telegraph noiseKonferenzbeitrag Inproceedings2009