IEEE International Electron Devices Meeting (IEDM)

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Description

Event name
IEEE International Electron Devices Meeting (IEDM)
 
Event type
Event for scientific audience
 
Start date
11-12-1988
End date
14-12-1988
 
Location
San Francisco, CA, USA
Country
 
Event format Veranstaltungsformat
On Site

Publications Publikationen

Filter:
Author:  Franco, J.
Date Issued:  [2009 TO 2009]

Results 1-1 of 1 (Search time: 0.001 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Grasser, T. ; Reisinger, H. ; Goes, W. ; Aichinger, Th. ; Hehenberger, Ph. ; Wagner, P.-J. ; Nelhiebel, M. ; Franco, J. ; Kaczer, B. Switching oxide traps as the missing link between negative bias temperature instability and random telegraph noiseKonferenzbeitrag Inproceedings2009