Symposium on VLSI Technology
Event name
Symposium on VLSI Technology
Start date
07-06-1994
End date
09-06-1994
Location
Honolulu
Country
Austria
Event format Veranstaltungsformat
On Site
Results 1-2 of 2 (Search time: 0.002 seconds).
| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Khalil, N. ; Faricelli, John ; Bell, D. ; Selberherr, Siegfried | A Novel Method for Extracting the Two-Dimensional Doping Profile of a Sub-Half Micron MOSFET | Konferenzbeitrag Inproceedings | 1994 | |
| 2 | Toledano-Luque, M. ; Kaczer, Ben ; Franco, J. ; Roussel, Ph. J. ; Grasser, Tibor ; Hoffmann, T.Y. ; Groeseneken, G. | From Mean Values to Distributions of BTI Lifetime of Deeply Scaled FETs Through Atomistic Understanding of the Degradation | Konferenzbeitrag Inproceedings | 2011 |