Lasers and Electro-Optics for Semiconductor Testing (IEEE-LEOS)

Event name
Lasers and Electro-Optics for Semiconductor Testing (IEEE-LEOS)
 
Event type
Event for scientific audience
 
Start date
26-10-2003
End date
30-10-2003
 
Location
Tucson, Arizona, USA
Country
Austria
 
Event format Veranstaltungsformat
On Site

Publications Publikationen

Results 1-2 of 2 (Search time: 0.005 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Kudielka, Klaus ; Klaus, Werner Optical homodyne PSK receiver: Phase synchronization by maximizing baseband signal powerKonferenzbeitrag Inproceedings1999
2Pogany, Dionyz ; Bychikhin, Sergey ; Dubec, Victor ; Blaho, M. ; Litzenberger, Martin ; Kuzmik, Jan ; Pflügl, Christian ; Strasser, Gottfried ; Gornik, Erich Transient interferometric mapping of temperature and free carriers in semiconductor devicesKonferenzbeitrag Inproceedings2003