Lasers and Electro-Optics for Semiconductor Testing (IEEE-LEOS)

Event name
Lasers and Electro-Optics for Semiconductor Testing (IEEE-LEOS)
 
Event type
Event for scientific audience
 
Start date
26-10-2003
End date
30-10-2003
 
Location
Tucson, Arizona, USA
Country
Austria
 
Event format Veranstaltungsformat
On Site

Publications Publikationen

Treffer 1-2 von 2 (Suchzeit: 0.001 Sekunden).

VorschauAutor_in(nen)TitelDokumenttypErscheinungs­datum
1Kudielka, Klaus ; Klaus, Werner Optical homodyne PSK receiver: Phase synchronization by maximizing baseband signal powerKonferenzbeitrag Inproceedings1999
2Pogany, Dionyz ; Bychikhin, Sergey ; Dubec, Victor ; Blaho, M. ; Litzenberger, Martin ; Kuzmik, Jan ; Pflügl, Christian ; Strasser, Gottfried ; Gornik, Erich Transient interferometric mapping of temperature and free carriers in semiconductor devicesKonferenzbeitrag Inproceedings2003